Note: development of high speed confocal 3D profilometer
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Updated: Apr 20, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Kar Tien Ang1, Zhong Ping Fang2, Arthur Tay1
1Electrical and Computer Engineering Department, National University of Singapore, 4 Engineering Drive 3, Singapore 117576.
Abstract:
A high-speed confocal 3D profilometer based on the chromatic confocal technology and spinning Nipkow disk technique has been developed and tested. It can measure a whole surface topography by taking only one image that requires less than 0.3 s. Surface height information is retrieved based on the ratios of red, green, and blue color information. A new vector projection technique has developed to enhance the vertical resolution of the measurement. The measurement accuracy of the prototype system has been verified via different test samples.
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