Confocal Fluorescence Microscopy
Atomic Force Microscopy
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Updated: Apr 20, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Kar Tien Ang1, Zhong Ping Fang2, Arthur Tay1
1Electrical and Computer Engineering Department, National University of Singapore, 4 Engineering Drive 3, Singapore 117576.
A novel high-speed confocal 3D profilometer achieves rapid whole-surface topography measurement using chromatic confocal technology and a spinning Nipkow disk. This system enhances vertical resolution for accurate surface analysis.
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