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Atomic Emission Spectroscopy: Instrumentation01:22

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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A Kirkpatrick-Baez microscope for the National Ignition Facility.

L A Pickworth1, T McCarville1, T Decker1

  • 1Lawrence Livermore National Laboratory, Livermore, California 94550, USA.

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|November 29, 2014
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Summary
This summary is machine-generated.

A new Kirkpatrick-Baez microscope (KBM) system improves x-ray imaging resolution for Inertial Confinement Fusion experiments at the National Ignition Facility. This advanced diagnostic achieves high resolution across a wide field of view, surpassing current pinhole limitations.

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Area of Science:

  • Plasma Physics
  • High-Energy-Density Physics
  • X-ray Optics

Background:

  • Current x-ray imaging at the National Ignition Facility (NIF) relies on pinhole cameras, which are limited to 10-25 μm resolution and low signal throughput for Inertial Confinement Fusion (ICF) applications.
  • These limitations hinder detailed analysis of ICF target dynamics and performance.

Purpose of the Study:

  • To develop and demonstrate a higher resolution and throughput x-ray imaging diagnostic for ICF applications at NIF.
  • To overcome the resolution and signal limitations of existing pinhole imaging techniques.

Main Methods:

  • Development of a Kirkpatrick-Baez microscope (KBM) system designed for high-resolution x-ray imaging.
  • Utilizing a multilayer coating for operation at 10.2 keV, targeting <9 μm resolution over a 300 μm field of view.
  • Acquisition and analysis of initial images from an uncoated NIF KBM configuration.

Main Results:

  • The uncoated NIF KBM configuration successfully demonstrated high-resolution imaging capabilities.
  • High resolution was achieved across the entire 300 μm field of view, validating the KBM design principles.
  • Initial results indicate the potential to surpass the resolution limits of current pinhole imagers.

Conclusions:

  • The Kirkpatrick-Baez microscope system shows significant promise for advancing x-ray imaging in ICF research.
  • This new diagnostic offers improved resolution and signal throughput compared to conventional pinhole imagers.
  • Further development with multilayer coatings is expected to enhance performance for NIF applications.