X-ray Imaging
Atomic Emission Spectroscopy: Instrumentation
Computed Tomography
Thomson's e/m Experiment
Electron Microscope Tomography and Single-particle Reconstruction
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
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Updated: Apr 20, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
D W Huang1, Z Y Chen1, Y H Luo1
1State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China.
A new hard X-ray detection array helps diagnose runaway electron loss in tokamaks. Most runaway electrons are lost at limiters, with biased probes and magnetic perturbations influencing their diffusion and loss rates.
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