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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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General solution for quantitative dark-field contrast imaging with grating interferometers.

M Strobl1

  • 11] European Spallation Source ESS AB, Instrument division, Tunavaegan 24, 22100 Lund, Sweden [2] University of Copenhagen, Niels Bohr Institute, Universitetsparken 5, 2100 Copenhagen, Denmark.

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|November 29, 2014
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Summary
This summary is machine-generated.

A new grating interferometer technique enables quantitative structural small-angle scattering with 3D imaging at lab-based X-ray and neutron sources. This breakthrough offers a two-orders-of-magnitude efficiency gain for materials characterization.

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Area of Science:

  • Materials Science
  • Physics
  • Engineering

Background:

  • Grating interferometer imaging with X-rays and neutrons shows potential in biology, medicine, engineering, and magnetism.
  • Dark-field imaging offers structural information beyond direct spatial resolution limits.
  • Current techniques lack methods to fully exploit this potential for non-destructive materials characterization.

Purpose of the Study:

  • To report a novel approach for exploiting grating interferometer imaging's potential.
  • To enable quantitative structural small-angle scattering (SAS) information with 3D spatial resolution.
  • To facilitate non-destructive materials characterization at lab-based sources.

Main Methods:

  • Development of a new grating interferometer-based imaging approach.
  • Integration of quantitative structural small-angle scattering (SAS) analysis.
  • Application at laboratory-based X-ray and neutron sources.

Main Results:

  • Achieved quantitative structural small-angle scattering (SAS) information.
  • Enabled 3-dimensional spatial image resolution.
  • Demonstrated a two orders of magnitude efficiency gain compared to existing methods.

Conclusions:

  • The new method unlocks the potential of grating interferometry for materials science.
  • It allows unprecedented structural investigations of complex materials.
  • This technique is applicable to both X-ray and neutron sources, enhancing accessibility.