Particle migration analysis in iterative classification of cryo-EM single-particle data

Bo Chen1, Bingxin Shen2, Joachim Frank3

  • 1Department of Biology, Columbia University, New York, NY 10027, USA.

Summary

Jumper analysis quantitatively determines convergence and class number in cryo-electron microscopy (cryo-EM) classification. This method reduces subjectivity by analyzing particle migration patterns, advancing automated single-particle reconstruction.