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Updated: Apr 20, 2026

Design and Characterization Methodology for Efficient Wide Range Tunable MEMS Filters
Published on: February 4, 2018
Design, characterization and analysis of a 0.35 μm CMOS SPAD
Khalil Jradi1, Denis Pellion1, Dominique Ginhac2
1Laboratory Electronique, Informatique et Image, Le2i UMR CNRS 6306, Aile de l'ingénieur-9, Avenue Alain Savary-BP 47870, Dijon Cedex 21078, France. denis.pellion@u-bourgogne.fr.
Abstract:
Most of the works about single-photon detectors rely on Single Photon Avalanche Diodes (SPADs) designed with dedicated technological processes in order to achieve single-photon sensitivity and excellent timing resolution. Instead, this paper focuses on the implementation of high-performance SPADs detectors manufactured in a standard 0.35-micron opto-CMOS technology provided by AMS. We propose a series of low-noise SPADs designed with a variable pitch from 20 µm down to 5 µm. This opens the further way to the integration of large arrays of optimized SPAD pixels with pitch of a few micrometers in order to provide high-resolution single-photon imagers. We experimentally demonstrate that a 20-micron SPAD appears as the most relevant detector in terms of Signal-to-Noise ratio, enabling emergence of large arrays of SPAD.
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