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Updated: Apr 19, 2026

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Published on: November 21, 2019
Thermal magnetic field noise: electron optics and decoherence
Stephan Uhlemann1, Heiko Müller1, Joachim Zach1
1CEOS Corrected Electron Optical Systems GmbH, Englerstraße28, 69126 Heidelberg, Germany.
Thermal magnetic field noise near electron beams causes decoherence in transmission electron microscopy (TEM). This study presents new experimental data and semi-analytical models to predict and understand these noise fields for improved TEM performance.
Area of Science:
- Physics
- Materials Science
- Electron Microscopy
Background:
- Thermal magnetic field noise from conductive materials near the electron beam is a newly identified source of decoherence in high-resolution transmission electron microscopy (TEM).
- This noise can limit the achievable resolution and coherence in TEM experiments.
Purpose of the Study:
- To experimentally investigate thermal magnetic field noise in layered magnetic and non-magnetic structures.
- To develop and validate semi-analytical models for predicting noise field characteristics (strength, bandwidth, spatial correlation).
- To quantitatively compare simulation results with experimental data.
Main Methods:
- Experimental measurements on layered magnetic and non-magnetic material structures.
- Derivation of semi-analytical models for simplified and general noise field scenarios.
- Quantitative comparison of model predictions with experimental data.
Main Results:
- New experimental data on thermal magnetic field noise in layered structures.
- Validated semi-analytical models capable of predicting noise field properties.
- Quantitative agreement between simulated and experimental noise field characteristics.
Conclusions:
- Thermal magnetic field noise is a significant factor affecting TEM performance.
- The developed models provide a powerful tool for understanding and mitigating this noise.
- This work contributes to improving the resolution and reliability of high-resolution TEM.
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