Statistical contact angle analyses; "slow moving" drops on a horizontal silicon-oxide surface.

M Schmitt1, J Grub1, F Heib1

  • 1Physical Chemistry, Saarland University, Campus B 2 2, 66123 Saarbrücken, Germany.

Summary

This study presents a new "slow movement" analysis method for accurately measuring contact angles on horizontal surfaces. This approach minimizes operator subjectivity and enhances the reproducibility of surface property characterization.