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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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E Metsanurk1, A Tamm2, A Caro3
1Department of Physics and Astronomy, Uppsala University, Box 516, SE-75120 Uppsala, Sweden.
Ab initio calculations reveal that defects in copper-niobium (Cu-Nb) multilayers are compact, unlike previous models. This highlights the limitations of empirical potentials for accurate atomistic modeling of metal interfaces.
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