Contaminant degradation by irradiated semiconducting silver chloride particles: kinetics and modelling

The kinetics and mechanism of light-mediated formic acid (HCOO(-)) degradation in the presence of semiconducting silver chloride particles are investigated in this study. Our experimental results show that visible-light irradiation of AgCl(s) results in generation of holes and electrons with the photo-generated holes and its initial oxidation product carbonate radical, oxidizing HCOO(-) to form CO2. The HCOO(-) degradation rate increases with increase in silver concentration due to increase in rate of photo-generation of holes while the increase in chloride concentration decreases the degradation rate of HCOO(-) as a result of the scavenging of holes by Cl(-), thereby resulting in decreased holes and carbonate radical concentration. The results obtained indicate that a variety of other solution conditions including dioxygen concentration, bicarbonate concentration and pH influence the availability of holes and hence the HCOO(-) degradation rate in a manner consistent with our understanding of key processes. Based on our experimental results, we have developed a kinetic model capable of predicting AgCl(s)-mediated HCOO(-) photo-degradation over a wide range of conditions.