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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.8K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Related Experiment Video

Updated: Apr 19, 2026

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
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Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

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Advanced atomic force microscopy techniques II

Thilo Glatzel1, Ricardo Garcia2, Thomas Schimmel3

  • 1Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.

Beilstein Journal of Nanotechnology
|January 1, 2015
PubMed
Summary

No abstract available in PubMed .

Keywords:
AFM

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