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Imaging local electric fields produced upon synchrotron X-ray exposure.

Christopher M Dettmar1, Justin A Newman1, Scott J Toth1

  • 1Department of Chemistry, Purdue University, West Lafayette, IN 47907; and.

Proceedings of the National Academy of Sciences of the United States of America
|January 2, 2015
PubMed
Summary

X-ray absorption in soft materials creates electric fields, detectable by second harmonic generation (SHG) microscopy. These fields, potentially affecting diffraction resolution, persist at cryogenic temperatures but vanish upon warming.

Keywords:
EFISHX-ray damagepiezoelectricstructural biologysynchrotron

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Area of Science:

  • Materials Science
  • Crystallography
  • Biophysics

Background:

  • Soft materials analysis using X-rays at cryogenic temperatures can induce damage.
  • Second harmonic generation (SHG) microscopy is a sensitive probe for visualizing electric fields.

Purpose of the Study:

  • To investigate the generation and characteristics of local electric fields induced by hard X-ray absorption in soft materials.
  • To explore the underlying mechanism of X-ray-induced SHG and its implications for diffraction analysis.

Main Methods:

  • Monte Carlo simulations of X-ray photoelectron trajectories.
  • Second harmonic generation (SHG) microscopy.
  • X-ray microbeam exposure of amorphous solvents and protein crystals.

Main Results:

  • Hard X-ray absorption in soft materials generates substantial local electric fields.
  • An electric-field-induced SHG (EFISH) mechanism is proposed and supported by simulations and experimental data.
  • X-ray-induced SHG was observed extending beyond the beam area and persisted for weeks under cryogenic conditions.
  • The induced fields disappeared upon warming to room temperature, suggesting a temperature-dependent phenomenon.

Conclusions:

  • X-ray-induced local electric fields are a significant factor in soft material analysis under cryogenic conditions.
  • The findings validate simulations of X-ray-induced damage and highlight the potential impact on diffraction resolution.
  • SHG microscopy provides a direct method to visualize and quantify these X-ray-induced electric fields.