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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Apr 19, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

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Published on: June 13, 2023

High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator:

M Balantekin¹, S Satır², D Torello²

¹Electrical and Electronics Engineering, İzmir Institute of Technology, Urla, İzmir 35430, Turkey.

The Review of Scientific Instruments

|January 3, 2015

Summary

This study introduces a novel, high-speed actuation method for tapping-mode atomic force microscopy (AFM) using cantilever eigenmodes. This approach enhances actuation speed without traditional piezotube actuators, even with standard cantilevers.

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Area of Science:

Physics
Materials Science
Nanotechnology

Background:

Conventional atomic force microscopy (AFM) systems rely on piezotube actuators for tip or sample movement.
High-speed actuation is crucial for improving the efficiency and resolution of AFM imaging.

Purpose of the Study:

To demonstrate a proof-of-principle for a high-speed actuation method in tapping-mode AFM.
To explore an alternative actuation mechanism that bypasses conventional piezotube limitations.

Main Methods:

Utilized a Q-controlled eigenmode of a cantilever for actuation.
Performed experiments to validate the high-speed actuation capability.
Tested the method with regular, non-specialized cantilevers.

Main Results:

Successfully demonstrated high-speed actuation using cantilever eigenmodes.
Showed that actuation speed can be significantly increased compared to conventional methods.
Confirmed the effectiveness of the method with standard AFM cantilevers.

Conclusions:

The proposed method offers a viable alternative for high-speed actuation in tapping-mode AFM.
This technique has the potential to enhance the performance of AFM systems.
Further development could lead to faster and more efficient nanoscale imaging and manipulation.