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Accurate signal sampling and reconstruction are crucial in various signal-processing applications. A time-domain signal's spectrum can be revealed using its Fourier transform. When this signal is sampled at a specific frequency, it results in multiple scaled replicas of the original spectrum in the frequency domain. The spacing of these replicas is determined by the sampling frequency.
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Note: High precision measurements using high frequency gigahertz signals.

Aohan Jin1, Siyuan Fu1, Atsunori Sakurai2

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Generalized lock-in amplifiers precisely analyze microwave signals using digital cavities. This technique measures physical medium changes, like temperature effects on signal phase and amplitude, enabling new metrology applications.

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Area of Science:

  • Physics
  • Electrical Engineering
  • Metrology

Background:

  • Generalized lock-in amplifiers achieve high precision measurements using digital cavities with Q-factors up to 5 × 10^8.
  • Accurate signal analysis is crucial for understanding wave propagation and material properties.

Purpose of the Study:

  • To demonstrate the application of generalized lock-in amplifiers for analyzing microwave signals with high precision.
  • To propose and verify a method for precisely measuring physical changes in a propagation medium using ultra-high precision signal analysis.

Main Methods:

  • Utilized generalized lock-in amplifiers to analyze gigahertz microwave signals.
  • Measured the effect of temperature-induced changes on the phase and amplitude of signals propagating through calibrated cables.
  • Verified Newton's law of cooling as a proof of concept.

Main Results:

  • Achieved precision of tens of hertz for microwave signal analysis.
  • Demonstrated the correlation between physical changes (temperature) and signal parameters (phase, amplitude).
  • Successfully verified Newton's law of cooling using the developed technique.

Conclusions:

  • Generalized lock-in amplifiers can precisely analyze microwave signals.
  • Physical changes in a propagation medium can be accurately measured via ultra-high precision signal analysis.
  • This technique offers potential for in situ metrology in material design by measuring properties like length and resistance.