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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Dominik Lembke1, Simone Bertolazzi, Andras Kis
1Electrical Engineering Institute, École Polytechnique Fédérale de Lausanne (EPFL) , CH-1015 Lausanne, Switzerland.
Two-dimensional materials like molybdenum disulfide (MoS2) offer unique electronic and optoelectronic properties. These materials show promise for advanced electronic circuits and flexible electronics.
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