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Related Concept Videos

Determination of Crystal Structures01:29

Determination of Crystal Structures

124
In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
124

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High Pressure Single Crystal Diffraction at PX^2
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Crystal structure refinement with SHELXL.

George M Sheldrick1

  • 1Department of Structural Chemistry, Georg-August Universität Göttingen, Tammannstraße 4, Göttingen 37077, Germany.

Acta Crystallographica. Section C, Structural Chemistry
|January 9, 2015
PubMed
Summary
This summary is machine-generated.

The SHELXL crystal structure refinement program now integrates seamlessly with the Crystallographic Information Framework (CIF) format. This simplifies archiving and enables advanced refinements, including neutron diffraction and disordered structures.

Keywords:
SHELXLSHREDCIFX-ray and neutron diffractioncrystal structure refinement

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Area of Science:

  • Crystallography
  • Materials Science
  • Structural Chemistry

Background:

  • The Crystallographic Information Framework (CIF) is crucial for validating and archiving crystal structures.
  • The SHELXL program is a widely used tool for crystal structure refinement.

Purpose of the Study:

  • To detail recent advancements in the SHELXL crystal structure refinement program.
  • To highlight the integration of SHELXL with the CIF format for streamlined data management.
  • To showcase new functionalities enhancing the program's capabilities.

Main Methods:

  • Integration of SHELXL with the CIF format, allowing a single file archive.
  • Development of the SHREDCIF program to extract necessary files (.hkl, .ins) from CIF.
  • Implementation of new algorithms for advanced refinement techniques.

Main Results:

  • A single CIF file now suffices for complete crystal structure archiving with embedded SHELXL instructions.
  • Recent SHELXL updates support neutron diffraction data, H atom treatment, and absolute structure determination.
  • The program now effectively refines twinned, disordered structures, and partial structure factors.

Conclusions:

  • SHELXL's latest version offers enhanced capabilities for crystal structure analysis.
  • The integration with CIF simplifies data archiving and accessibility.
  • SHELXL is freely available for academic use across multiple operating systems and processor architectures.