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Author Spotlight: Exploring Self-Assembled MOF-Polymer Composites
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Characterizing the metal-SAM interface in tunneling junctions.

Carleen M Bowers1, Kung-Ching Liao, Tomasz Zaba

  • 1Department of Chemistry and Chemical Biology, Harvard University , 12 Oxford Street, Cambridge, Massachusetts 02138, United States.

ACS Nano
|January 13, 2015
PubMed
Summary

The metal-SAM interface (gold/silver and thiolate/carboxylate/acetylene) does not significantly affect charge transport across tunneling junctions. Interface properties were indistinguishable, indicating they do not shape the tunneling barrier.

Keywords:
EGaInalkynescharge transportmolecular electronicsself-assembled monolayer

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Area of Science:

  • Surface Science
  • Electrochemistry
  • Materials Science

Background:

  • Understanding charge transport across metal-SAMs-insulator-metal junctions is crucial for molecular electronics.
  • The role of the metal-SAM interface in dictating charge transport kinetics requires further elucidation.

Purpose of the Study:

  • To investigate the influence of the metal electrode (gold or silver) and anchoring group (thiolate, carboxylate, acetylene) on charge transport.
  • To determine if the metal/SAM interface properties significantly impact the tunneling barrier and charge injection.

Main Methods:

  • Fabrication of Metal/SAM/Ga2O3/EGaIn junctions using gold and silver electrodes with n-alkyl SAMs.
  • Measurement of current density-voltage (J(V)) characteristics for various metal/anchoring group combinations.
  • Analysis of J(V) data using the Simmons equation to extract parameters J0 and β.

Main Results:

  • Current density (J(V)) measurements revealed indistinguishable values for J0 and β across four different metal/SAM interfaces.
  • The anchoring groups, despite significant differences in electronic and physical properties, did not influence the injection current (J0).

Conclusions:

  • The investigated metal/SAM interfaces (Au/SR, Ag/SR, Ag/O2CR, Au/C≡CR) do not contribute to the shape of the tunneling barrier.
  • Interface properties have a negligible effect on charge transport kinetics in these specific junction structures.