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Depth-sensitive subsurface imaging of polymer nanocomposites using second harmonic Kelvin probe force microscopy
Octavio Alejandro Castañeda-Uribe1, Ronald Reifenberger, Arvind Raman
1†Department of Electrical and Electronic Engineering and Centro de Microelectrónica (CMUA), Universidad de los Andes, Bogotá 11001, Colombia.
ACS Nano
|January 16, 2015
Summary
This study visualizes buried Single Walled Carbon Nanotubes (SWCNTs) in polymer nanocomposites using Kelvin Probe Force Microscopy (KPFM). The technique reveals SWCNT distribution and depth, with resolution decreasing for deeper structures.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Science
Background:
- Polymer nanocomposites are crucial for advanced applications.
- Visualizing buried nanostructures like Single Walled Carbon Nanotubes (SWCNTs) is challenging.
- Kelvin Probe Force Microscopy (KPFM) offers potential for subsurface imaging.
Purpose of the Study:
- To investigate the depth sensitivity and spatial resolution of subsurface imaging in polymer nanocomposites.
- To visualize the clustering and percolation of buried SWCNTs using KPFM.
- To develop a method for three-dimensional subsurface structure reconstruction.
Main Methods:
- Utilized second harmonic mapping in KPFM for subsurface imaging.
- Developed a multilayered Polyimide (PI) sample with embedded SWCNT nanocomposite films.
- Acquired capacitance gradient (∂C/∂z) maps at varying depths within the sample.
Main Results:
- Successfully visualized buried SWCNTs up to a depth of approximately 430 nm.
- Observed a progressive deterioration in spatial resolution with increasing depth of SWCNTs.
- Correlated computational trends of ∂C/∂z with CNT depth to understand sensitivity and resolution limitations.
Conclusions:
- KPFM's capacitance gradient mapping enables subsurface imaging of SWCNTs in polymer nanocomposites.
- Depth resolution is limited by field penetration and spreading, offering insights for 3D reconstruction.
- This work paves the way for nondestructive 3D tomography and nanometrology in nanocomposites.
