Thorough subcells diagnosis in a multi-junction solar cell via absolute electroluminescence-efficiency measurements
Shaoqiang Chen1, Lin Zhu2, Masahiro Yoshita2
11] Institute for Solid State Physics, University of Tokyo, and JST-CREST, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan [2] Department of Electronic Engineering, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China.
Abstract:
World-wide studies on multi-junction (tandem) solar cells have led to record-breaking improvements in conversion efficiencies year after year. To obtain detailed and proper feedback for solar-cell design and fabrication, it is necessary to establish standard methods for diagnosing subcells in fabricated tandem devices. Here, we propose a potential standard method to quantify the detailed subcell properties of multi-junction solar cells based on absolute measurements of electroluminescence (EL) external quantum efficiency in addition to the conventional solar-cell external-quantum-efficiency measurements. We demonstrate that the absolute-EL-quantum-efficiency measurements provide I-V relations of individual subcells without the need for referencing measured I-V data, which is in stark contrast to previous works. Moreover, our measurements quantify the absolute rates of junction loss, non-radiative loss, radiative loss, and luminescence coupling in the subcells, which constitute the "balance sheets" of tandem solar cells.


