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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Related Experiment Video

Updated: Apr 18, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques
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Telecentric 3D profilometry based on phase-shifting fringe projection.

Dong Li, Chunyang Liu, Jindong Tian

    Optics Express
    |January 22, 2015
    PubMed
    Summary

    This study introduces a new telecentric fringe projection method for precise 3D shape measurement of small, thick objects. The technique enhances depth of field and simplifies calibration for accurate microscopic measurements.

    Area of Science:

    • Metrology
    • Optical Engineering
    • Microscopy

    Background:

    • Microscopic 3D shape measurement is crucial for micro-manufacturing.
    • Existing fringe projection methods have limited depth of field and complex calibration.
    • Non-telecentric microscopes struggle with measuring complete object depths.

    Purpose of the Study:

    • To develop a novel telecentric phase-shifting projected fringe profilometry system.
    • To enable accurate 3D shape measurement of small and thick objects.
    • To overcome limitations of conventional microscopic fringe projection.

    Main Methods:

    • Utilized telecentric imaging to significantly extend the depth of field.
    • Developed a new system calibration method for camera and projector based on a telecentric imaging model.

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  • Implemented 3D reconstruction using telecentric imaging combined with stereovision and fringe phase maps.

    • Main Results:

    • Achieved an extended depth of field, orders of magnitude larger than traditional microscopy.
    • Simplified the calibration process, eliminating the need for precision translation stages and reference planes.
    • Demonstrated high measurement accuracy for the 3D shape of thick objects through experimental validation.

    Conclusions:

    • The proposed telecentric fringe projection profilometry is feasible and accurate for measuring thick micro-objects.
    • This method offers a robust solution for challenging 3D shape measurement tasks in micro-manufacturing.
    • The enhanced depth of field and simplified calibration represent significant advancements in the field.