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Related Experiment Video

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Application of a synthetic extended source for interferometry.

Sophie Morel, Matthew Dubin, Joe Shiefman

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    |January 22, 2015
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    Summary

    This study introduces a synthetic extended source (SES) to minimize coherent noise in interferometric measurements. By averaging translated point source data, SES effectively simulates an extended source, improving measurement accuracy.

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    Area of Science:

    • Optical Physics
    • Metrology

    Background:

    • Coherent noise in interferometric measurements degrades data quality.
    • Traditional extended sources can be complex to implement and may reduce interferogram contrast.

    Purpose of the Study:

    • To design and evaluate a synthetic extended source (SES) for reducing coherent noise in interferometric measurements.
    • To develop a model for quantifying measurement noise and validate SES performance.

    Main Methods:

    • Utilizing a fully coherent point source for data acquisition.
    • Translating the point source along a defined trajectory to synthesize an extended source behavior.
    • Averaging multiple measurements to reduce coherent noise.
    • Developing a parametric model to assess noise from particle diffraction.

    Main Results:

    • The synthetic extended source (SES) effectively reduces coherent noise in interferometric measurements.
    • Experimental results validate the developed parametric noise model and SES performance.
    • High-contrast interferograms are preserved during data acquisition.

    Conclusions:

    • The SES provides a viable method for mitigating coherent noise in interferometry.
    • The developed modeling approach accurately predicts noise and aids SES design.
    • A practical SES implementation in a custom SPSI interferometer demonstrates its utility.