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Updated: Apr 18, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
Shaun C Walker1, Stephanie Allen, Gordon Bell
1Laboratory of Biophysics and Surface Analysis, School of Pharmacy, The University of Nottingham, University Park, Nottingham, UK.
Scanning ion conductance microscopy (SICM) offers a novel method for imaging leaf surfaces, overcoming limitations of traditional techniques like scanning electron microscopy (SEM) and atomic force microscopy (AFM). This advanced imaging reveals in situ surface wetting phenomena.
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