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Restoring defect structures in 3C-SiC/Si (001) from spherical aberration-corrected high-resolution transmission

C Wen1, W Wan2, F H Li2

  • 1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; School of Science, Southwest University of Science and Technology, Mianyang 621010, China.

Micron (Oxford, England : 1993)
|February 1, 2015
PubMed

Keywords:
3C-SiC/SiAberration-corrected high-resolution transmission electron microscopyImage deconvolutionLomer dislocationPerfect 60° dislocationStacking fault

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