Reflective multilayer optic as hard X-ray diagnostic on laser-plasma experiment

A multilayer-based optic was tested for use as an X-ray diagnostic on a laser-plasma experiment. The multilayer optic was employed to selectively pass X-rays between 55 and 100 keV. An order of magnitude improvement in signal-to-noise ratio is achieved compared to a transmission crystal spectrometer. A multilayer response model, taking into account the source size and spectral content, is constructed and the outlook for application above 500 keV is briefly discussed. LLNL-JRNL-664311.