Mapping of ferroelectric domain structure using angle-resolved piezoresponse force microscopy

Angle-resolved piezoresponse force microscopy (AR-PFM) was used in conjunction with electron backscatter diffraction (EBSD) to study ferroelectric domain structure in polycrystalline near-morphotropic lead zirconate titanate (PZT). We introduce the details of AR-PFM including experimental method, the process to generate AR-PFM maps, and the interpretation of AR-PFM map, using domain patterns observed in bulk PZT. The spatial distortion caused by scanner creep and non-linearity in scanning probe microscopy was corrected through image registration, taking advantage of the features present in topography images. Domain structures were mapped using AR-PFM data, and the maps consistently show alternating piezoresponse axes in a lamellar pattern of non-180° domain structure. Comparison of AR-PFM and EBSD data showed a discrepancy between the direction of lateral surface displacement and the in-plane polarization direction. Additionally, using suitable domain patterns, AR-PFM enabled discrimination between the tetragonal and rhombohedral phases at the sub-grain scale.