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Related Concept Videos

Biasing of P-N Junction01:16

Biasing of P-N Junction

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The operation of a p-n junction diode involves various biasing conditions, including forward bias, reverse bias, and equilibrium.
In equilibrium, no external voltage is applied across the p-n junction. The depletion region is formed at the junction interface due to the diffusion of carriers, which leaves behind charged dopants, acceptors on the p-side, and donors on the n-side. These immobile charges create an electric field that prevents further diffusion of carriers. The related energy band...
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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
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Structural and optical properties of disc-in-wire InGaN/GaN LEDs.

Lifan Yan1, Shafat Jahangir, Scott A Wight

  • 1Department of Material Science and Engineering and ‡Center of Photonics and Multiscale Nanomaterials, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor, Michigan 48109-2130, United States.

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Summary

This study on Indium Gallium Nitride/Gallium Nitride (InGaN/GaN) nanowire LEDs reveals that lower nanowire coverage enhances Gallium Nitride (GaN) bandgap emission. Nanocrowns from stacking faults likely reduce optical output.

Keywords:
InGaNLEDscathodoluminescencedisc-in-wire nanowire

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Area of Science:

  • Semiconductor Nanostructures
  • Optoelectronics
  • Materials Science

Background:

  • Indium Gallium Nitride/Gallium Nitride (InGaN/GaN) nanowires are crucial for light-emitting diode (LED) development.
  • Understanding microstructure-optical property relationships is key to optimizing nanowire LED performance.
  • Silicon (Si) substrates offer a scalable platform for nanowire growth.

Purpose of the Study:

  • To investigate how nanowire coverage affects the microstructure and optical properties of InGaN/GaN nanowire LEDs on Si(111).
  • To correlate structural features with observed optical emission characteristics.

Main Methods:

  • Fabrication of InGaN/GaN nanowire LED structures on Si(111) with varying nanowire coverages.
  • Cathodoluminescence (CL) spectroscopy to analyze optical emission.
  • Transmission electron microscopy (TEM) to examine microstructure and morphology.

Main Results:

  • All samples showed broad emission around 1.95 eV (635 nm).
  • Higher Gallium Nitride (GaN) bandgap emission (∼3.4 eV) was observed with decreased nanowire coverage, correlating with reduced coalescence.
  • Variations in Indium Gallium Nitride (InGaN) disc morphology (faceted layers, quantum dots) and nonepitaxial
  • nanocrown
  • branching from stacking faults were identified via TEM.

Conclusions:

  • Nanowire coverage significantly influences the optical properties of InGaN/GaN nanowire LEDs.
  • Reduced nanowire coalescence and the presence of nanocrowns, likely due to grain boundaries, can impact emission intensity and quality.