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Updated: Apr 17, 2026

Using Microwave and Macroscopic Samples of Dielectric Solids to Study the Photonic Properties of Disordered Photonic Bandgap Materials
Published on: September 26, 2014
Hafnium silicate: a new microwave dielectric ceramic with low thermal expansivity
Jobin Varghese1, Tony Joseph, K P Surendran
1Functional Materials Group, Materials Science & Technology Division, CSIR NIIST, Thiruvananthapuram, Kerala 695 019, India.
Abstract:
A HfSiO4 ceramic was prepared by a conventional solid state synthesis method by sintering at 1600 °C. The morphology of the sintered surface was characterized using scanning electron microscopy and atomic force microscopy and the average surface roughness was about 118 nm. The sintered HfSiO4 ceramic has εr = 7.0, Qu × f = 25 000 and τf = -44 ppm °C(-1) at 10 GHz. It exhibits promising thermal properties such as a low linear thermal expansivity (CTE) of -1.8 ppm °C(-1) (dilatometer) in the temperature range of 30-800 °C and a room temperature thermal conductivity of 11 W m(-1) K(-1).
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