Critical slowing down in networks generating temporal complexity
M T Beig1, A Svenkeson2, M Bologna3
1Center for Nonlinear Science, University of North Texas, Denton, Texas 76203, USA.
Abstract:
We study a nonlinear Langevin equation describing the dynamic variable X(t), the mean field (order parameter) of a finite size complex network at criticality. The conditions under which the autocorrelation function of X shows any direct connection with criticality are discussed. We find that if the network is prepared in a state far from equilibrium, X(0)=1, the autocorrelation function is characterized by evident signs of critical slowing down as well as by significant aging effects, while the preparation X(0)=0 does not generate evident signs of criticality on X(t), in spite of the fact that the same initial state makes the fluctuating variable η(t)≡sgn(X(t)) yield significant aging effects. These latter effects arise because the dynamics of η(t) are directly dependent on crucial events, namely the re-crossings of the origin, which undergo a significant aging process with the preparation X(0)=0. The time scale dominated by temporal complexity, aging, and ergodicity breakdown of η(t) is properly evaluated by adopting the method of stochastic linearization which is used to explain the exponential-like behavior of the equilibrium autocorrelation function of X(t).
More Related Videos
Related Concept Videos
Rapidly Varying Flow
Entropy Changes Accompanying Specific Processes
Sequence Networks of Rotating Machines
Zero-sequence current induces a voltage drop across the generator's neutral impedance and other...
Linear time-invariant Systems
The input-output behavior of an LTI system can be fully defined by its response to an impulsive excitation at its input. Once this impulse response is known, the system's reaction to any other input can be...
Drug Concentration Versus Time Correlation
Two pivotal parameters are the minimum effective concentration (MEC) and the minimum toxic concentration (MTC). The MEC is the...
Current Growth And Decay In RL Circuits


