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Non-exponential resistive switching in Ag2S memristors: a key to nanometer-scale non-volatile memory devices
Agnes Gubicza1, Miklós Csontos, András Halbritter
1Department of Physics, Budapest University of Technology and Economics, Budafoki ut 8, 1111 Budapest, Hungary. gubicza@dept.phy.bme.hu.
Abstract:
The dynamics of resistive switchings in nanometer-scale metallic junctions formed between an inert metallic tip and an Ag film covered by a thin Ag2S layer are investigated. Our thorough experimental analysis and numerical simulations revealed that the resistance change upon a switching bias voltage pulse exhibits a strongly non-exponential behaviour yielding markedly different response times at different bias levels. Our results demonstrate the merits of Ag2S nanojunctions as nanometer-scale non-volatile memory cells with stable switching ratios, high endurance as well as fast response to write/erase, and an outstanding stability against read operations at technologically optimal bias and current levels.
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