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A high resolution on-chip delay sensor with low supply-voltage sensitivity for high-performance electronic systems.

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This study introduces an all-digital on-chip delay sensor (OCDS) circuit. The novel design achieves picosecond resolution and low supply-voltage sensitivity for advanced electronic systems.

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Area of Science:

  • Electrical Engineering
  • Microelectronic Systems
  • Sensor Technology

Background:

  • High-performance electronic systems require precise delay measurements for efficient operation and diagnosis.
  • Existing on-chip delay sensors often suffer from limited resolution and sensitivity to power supply fluctuations.
  • Integration of accurate and robust delay sensing is crucial for system-level reliability.

Purpose of the Study:

  • To present an all-digital on-chip delay sensor (OCDS) circuit.
  • To achieve high delay-measurement resolution and low supply-voltage sensitivity.
  • To enable efficient detection and diagnosis in high-performance electronic systems.

Main Methods:

  • Development of a novel all-digital on-chip delay sensor (OCDS) circuit.
  • Implementation of a proposed delay measurement scheme for high quantization resolution.
  • Design of a cascade-stage delay measurement circuit for enhanced supply-voltage immunity.

Main Results:

  • Achieved a quantization resolution down to several picoseconds.
  • Demonstrated a delay measurement resolution improvement to 1.2 ps.
  • Exhibited an average delay resolution variation of only 0.55% with ±10% supply-voltage variations.
  • Verified the all-digital implementation suitability for system integration.

Conclusions:

  • The proposed OCDS circuit offers superior delay-measurement resolution and stability.
  • The design effectively mitigates supply-voltage sensitivity without complex calibration.
  • The all-digital nature facilitates seamless integration into high-performance electronic systems.