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Updated: Apr 17, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
Claudia Bich1, David Touboul1, Alain Brunelle1
1Institut de Chimie des Substances Naturelles, UPR2301, CNRS, Avenue de la Terrasse, 91198 Gif-sur-Yvette, France.
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides high-resolution molecular imaging for biomedical applications. This technique enables detailed mapping of organic compounds directly on tissue sections without complex sample preparation.
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