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Published on: October 2, 2016
Applications of a versatile modelling approach to 3D atom probe simulations
Christian Oberdorfer1, Sebastian Manuel Eich1, Martin Lütkemeyer2
1Institute of Materials Science, University of Stuttgart, Heisenbergstr. 3, 70569 Stuttgart, Germany.
This study introduces a flexible simulation method using Voronoi cells to model atomic structures and simulate atom evaporation from field emitters. The approach accurately predicts field desorption maps and analyzes stress on nanoparticles during evaporation.
Area of Science:
- Materials Science
- Computational Physics
- Surface Science
Background:
- Atom Probe Tomography (APT) field emitters require detailed atomic structure modeling.
- Simulating atom evaporation under electric fields is crucial for understanding emitter behavior.
Purpose of the Study:
- To present a flexible simulation approach for modeling arbitrary crystal structures and simulating atom evaporation.
- To analyze field desorption maps and the effects of inhomogeneous evaporation conditions.
Main Methods:
- Utilizing an irregular mesh of Voronoi cells to represent atomic structures (Wigner-Seitz cells).
- Solving the Poisson equation for electric field calculations.
- Calculating field-induced forces to simulate atom evaporation sequences.
Main Results:
- Simulated field desorption maps for various crystal structures (fcc, hcp, sc, bcc) and orientations.
- Demonstrated the impact of inhomogeneous evaporation on emitter apex curvature.
- Analyzed reconstructions of grain boundaries and estimated stress on embedded nanoparticles.
Conclusions:
- The flexible Voronoi cell simulation approach enables accurate modeling of complex atomic structures and evaporation processes.
- The method provides insights into emitter performance, material behavior under stress, and surface phenomena.
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