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The many issues in reliability research: choosing from a horn of plenty
Klaas Sijtsma1, L Andries van der Ark
1Klaas Sijtsma, PhD, is Full Professor, Department of Methodology and Statistics, TSB, Tilburg University, The Netherlands. L. Andries van der Ark, PhD, is Associate Professor, Research Institute for Child Development and Education, University of Amsterdam, The Netherlands.
Abstract:
We respond to three commentaries on our discussion article on different conceptions of test score reliability. First, we discuss the use of standard errors for reliability estimates. Second, we discuss the desirability not to confuse issues pertaining to the dimensionality of the test data (closely related to construct validity) and the degree to which measurement values are repeatable under the same circumstances (i.e., the reliability issue). Third, we discuss a new reliability estimation method that is almost unbiased irrespective of the dimensionality of the test data.
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