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Untargeted Liquid Chromatography-Mass Spectrometry-Based Metabolomics Analysis of Wheat Grain
Published on: March 13, 2020
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[Nondestructive evaluation of wheat quality using terahertz time domain spectroscopy]
Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
|March 11, 2015
Summary
Terahertz time-domain spectroscopy (THz-TDS) non-destructively assesses wheat quality by analyzing optical properties. This method effectively differentiates various deterioration levels in wheat kernels, aiding agricultural quality control.
Area of Science:
- Agricultural Science
- Spectroscopy
- Material Science
Background:
- Wheat quality assessment is crucial for agricultural production and food security.
- Current methods for detecting wheat deterioration can be destructive or time-consuming.
- Developing rapid, non-destructive techniques for quality control is essential.
Purpose of the Study:
- To investigate the potential of Terahertz time-domain spectroscopy (THz-TDS) for evaluating wheat kernel quality.
- To analyze the spectral properties of wheat kernels with varying degrees of deterioration.
- To establish correlations between optical parameters and wheat quality indicators.
Main Methods:
- Terahertz time-domain spectroscopy (THz-TDS) was applied to analyze wheat kernels.
- Wheat samples included normal, worm-eaten, moldy, and sprouting kernels.
- Optical parameters, including absorption coefficient and refractive index, were calculated in the 0.2-1.6 THz range.
Main Results:
- Distinct differences in absorption coefficients and refractive indices were observed among wheat samples of different deterioration levels.
- The absorption coefficient of normal wheat was significantly higher than that of deteriorated samples.
- Refractive index showed an increasing trend with increasing frequency.
Conclusions:
- THz-TDS is a viable and promising non-destructive method for assessing wheat kernel quality.
- The technique can differentiate between various types and degrees of wheat deterioration.
- This study provides a foundation for implementing THz-TDS in stored-grain quality analysis and control.

