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CIDRE: an illumination-correction method for optical microscopy
Kevin Smith1, Yunpeng Li2, Filippo Piccinini3
1Scientific Center for Optical and Electron Microscopy, ETH Zürich, Zurich, Switzerland.
Abstract:
Uneven illumination affects every image acquired by a microscope. It is often overlooked, but it can introduce considerable bias to image measurements. The most reliable correction methods require special reference images, and retrospective alternatives do not fully model the correction process. Our approach overcomes these issues for most optical microscopy applications without the need for reference images.
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