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Updated: Apr 16, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Design and application of a novel in situ nano-manipulation stage for transmission electron microscopy
Bon-Woong Koo1, Seung-Pyo Hong1, Seong-Il Kim1
1Department of Materials Science and Engineering,Research Institute of Advanced Materials (RIAM),Seoul National University,1 Gwanak-ro Gwanak-gu,Seoul 151-744,Republic of Korea.
Abstract:
A novel nano-scale manipulator capable of handling low-dimensional materials with three-dimensional linear motion, gripping action, and push-pull action of the gripper was developed for an in situ experiment in transmission electron microscopy. X-Y-Z positioning and push-pull action were accomplished by a piezotubing system, combined with a specially designed assembly stage that consisted of a lever-action gripping tip backed by a push-pull piezostack. The gripper tip consisted of tungsten wire fabricated by electrochemical etching followed by a focused ion beam process. Performance of the nano-scale manipulator was demonstrated in a grab-and-pick test of a single silver nanowire and in an in situ tensile test of a pearlitic steel sample with a specific orientation.
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