Semiconductors
Types of Semiconductors
Metal-Semiconductor Junctions
Schottky Barrier Diode
Biasing of Metal-Semiconductor Junctions
Fermi Level Dynamics
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Updated: Apr 16, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Steven R Schofield1, Sven Rogge
1London Centre for Nanotechnology, and Department of Physics and Astronomy, University College London, London, WC1H 0AH, UK. Centre for Quantum Computation and Communication Technology, School of Physics, The University of New South Wales, Sydney, NSW 2052, Australia.
No abstract available in PubMed .