In silico risk assessment for skin sensitization using artificial neural network analysis

Kyoko Tsujita-Inoue1, Tomomi Atobe, Morihiko Hirota

  • 1Shiseido Research Center, Shiseido Co. Ltd.

Summary

Predicting chemical skin sensitization potential is crucial. An artificial neural network (ANN) model using in silico data shows promise, and combining it with in vitro data offers a powerful approach for integrated risk assessment.

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