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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 15, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM

Horacio V Guzman¹, Pablo D Garcia¹, Ricardo Garcia¹

¹Instituto de Ciencia de Materiales de Madrid, CSIC, Sor Juan Inés de la Cruz 3, 28049 Madrid, Spain.

Beilstein Journal of Nanotechnology

|March 31, 2015

Summary

dForce is a new simulation environment for dynamic force microscopy. It aids understanding of tapping mode and bimodal AFM experiments, offering detailed insights into tip-surface interactions and mechanics.

Keywords:

bimodal AFM dynamic AFM nanomechanics numerical simulations tapping mode AFM

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Area of Science:

Materials Science
Physics
Nanotechnology

Background:

Dynamic force microscopy (DFM) techniques like tapping mode AFM and bimodal AFM are crucial for nanoscale characterization.
Accurate simulation of cantilever-tip dynamics is essential for interpreting experimental data and optimizing measurement parameters.
Existing simulation tools may lack comprehensive models or user-friendly interfaces for diverse experimental conditions.

Purpose of the Study:

To introduce dForce, a novel simulation environment for dynamic force microscopy (DFM).
To provide a versatile tool for understanding tapping mode AFM and bimodal AFM experiments in various environments (air, liquid).
To enable detailed analysis of tip-surface interactions and mechanical properties during AFM measurements.

Main Methods:

Development of a simulation environment, dForce, incorporating cantilever-tip dynamics.
Implementation of various interaction and contact mechanics models (van der Waals, Hertz, DMT, JKR, viscoelastic models).
Comparison of numerical integration methods for optimal accuracy and speed; design of a user-friendly graphical interface.

Main Results:

dForce simulates key variables like instantaneous deflection, tip-surface force, velocity, dissipated energy, and sample deformation.
The simulator supports diverse experimental conditions and includes advanced contact mechanics models.
Accuracy validation against 18 years of numerical simulation data confirms dForce's reliability.

Conclusions:

dForce offers a robust and accessible platform for simulating dynamic force microscopy experiments.
The simulator enhances the understanding of complex tip-surface interactions and material properties.
dForce facilitates non-expert use, promoting broader application in AFM research and development.