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Updated: Apr 15, 2026

Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography
Published on: February 12, 2017
Waiz Karim1, Simon Andreas Tschupp, Mehtap Oezaslan
1Laboratory for Micro and Nanotechnology, Paul Scherrer Institute, 5232 Villigen-PSI, Switzerland. yasin.ekinci@psi.ch.
Extreme ultraviolet (EUV) lithography enables high-throughput fabrication of 15 nm nanoparticle arrays over large areas. This advancement facilitates the study of nanoparticle properties using well-defined model systems.
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