Improved resolution in SPR and MCWG microscopy by combining images acquired with distinct mode propagation directions

In high-resolution surface plasmon (SPR) imaging, lateral resolution is limited along the direction of plasmon propagation by the longitudinal decay length. Though SPR systems can achieve sub-micrometer resolution, the decay length causes a degradation in the images in the direction of plasmon propagation akin to a blurring artifact, with ringing along resonant to nonresonant transition edges. We present a method to significantly reduce this effect based on combining images of a sample acquired with distinct guided-mode propagation directions. As SPR is a special case of the class of optical structures known as metal-clad waveguides (MCWG) that are also affected by the decay length, this work is broadly applicable.