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Updated: Apr 15, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

A subsurface add-on for standard atomic force microscopes.

G J Verbiest¹, D J van der Zalm², T H Oosterkamp²

¹JARA-FIT and II. Institute of Physics, RWTH Aachen University, 52074 Aachen, Germany.

The Review of Scientific Instruments

|April 3, 2015

Summary

This summary is machine-generated.

This study developed an add-on for Atomic Force Microscopes (AFM) to enable subsurface imaging using ultrasound. The innovation overcomes electronic crosstalk and weak cantilever excitation for MHz frequencies.

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Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Atomic Force Microscopy (AFM) typically provides surface information.
Accessing subsurface details with AFM is limited due to technical challenges.
Existing commercial AFM systems lack integrated ultrasonic capabilities.

Purpose of the Study:

To develop an add-on module for AFM systems to enable ultrasonic subsurface imaging.
To address the limitations of electronic crosstalk and insufficient cantilever excitation at MHz frequencies.
To facilitate subsurface measurements using existing AFM instrumentation.

Main Methods:

Development of a specialized add-on module for AFM.
Integration of a unique piezo element with a 2.5 MHz lowest resonance frequency.
Implementation of a separated electronic connection for the high-frequency piezo element.

Main Results:

The developed add-on effectively overcomes electronic crosstalk in AFM setups.
Sufficient cantilever excitation at ultrasonic (MHz) frequencies is achieved.
The add-on enables subsurface measurements with nanometer resolution.

Conclusions:

The developed add-on provides a viable solution for subsurface imaging with existing AFMs.
This advancement supports researchers in performing advanced subsurface analyses.
The work paves the way for future commercial AFM systems capable of subsurface imaging.