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Magneto-optical Kramers-Kronig analysis.

Julien Levallois1, Ievgeniia O Nedoliuk1, Iris Crassee1

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A new magneto-optical Kramers-Kronig analysis (MOKKA) enables dielectric function extraction without circularly polarized light. This efficient method uses standard polarizers for broad frequency analysis of materials like graphene.

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Area of Science:

  • Condensed Matter Physics
  • Materials Science
  • Spectroscopy

Background:

  • Determining the complex dielectric function is crucial for understanding material optical properties.
  • Conventional Kramers-Kronig analysis requires specific experimental conditions and often full spectral data.
  • Magneto-optical techniques are vital for probing electronic structures influenced by magnetic fields.

Purpose of the Study:

  • To introduce a novel magneto-optical Kramers-Kronig analysis (MOKKA) for dielectric function determination.
  • To develop an experimental method that bypasses the need for generating circularly polarized light.
  • To enable efficient and versatile characterization of magneto-optical responses across a wide frequency range.

Main Methods:

  • A simplified magneto-optical experiment measuring reflectivity and Kerr rotation, or transmission and Faraday rotation.
  • Utilizing standard broadband polarizers at normal incidence, avoiding complex optical components like retarders.
  • Implementing a fast measurement protocol with fixed polarizers (45°) for small magneto-optical rotations.

Main Results:

  • Successful extraction of complex dielectric functions for left- and right-handed circular polarizations.
  • Demonstrated application to semimetals (bismuth, graphite) and graphene on SiC.
  • Obtained handedness-resolved magneto-absorption spectra of graphene.

Conclusions:

  • MOKKA provides a powerful, time-efficient generalization of Kramers-Kronig analysis for magneto-optical phenomena.
  • The technique is adaptable to various experimental constraints, including ultra-high magnetic fields.
  • This method offers a versatile approach for characterizing the optical and electronic properties of magnetic materials.