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Updated: Apr 15, 2026

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

A methodology for high resolution digital image correlation in high temperature experiments.

Justin Blaber¹, Benjamin S Adair¹, Antonia Antoniou¹

¹The Woodruff School of Mechanical Engineering, 801 Ferst Drive, Atlanta, Georgia 30332, USA.

The Review of Scientific Instruments

|April 3, 2015

Summary

This summary is machine-generated.

We developed a new method for high-resolution Digital Image Correlation (DIC) during high-temperature mechanical testing. This technique enables detailed strain mapping of materials at extreme temperatures, crucial for advanced engineering applications.

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Area of Science:

Materials Science
Mechanical Engineering
Optical Metrology

Background:

High-temperature mechanical testing requires precise strain measurement.
Digital Image Correlation (DIC) is a powerful tool for strain analysis.
Existing DIC methods face challenges at elevated temperatures due to surface stability and optical limitations.

Purpose of the Study:

To present a novel methodology for high-resolution DIC analysis in high-temperature mechanical tests.
To enable accurate strain mapping of materials under extreme thermal conditions.

Main Methods:

Development of a stable, high-quality surface patterning technique for metals.
Implementation of a simplified optical system using a visible-range camera and long-range microscope.
Utilizing a custom-developed, open-source DIC software for data analysis.

Main Results:

Successful acquisition of high-resolution strain maps.
Detailed analysis of the crack tip field in a nickel superalloy sample.
Demonstration of the technique's efficacy at 1000°C.

Conclusions:

The proposed methodology provides a robust solution for high-temperature DIC analysis.
This technique facilitates precise characterization of material behavior under extreme conditions.
The developed open-source software contributes to the accessibility of advanced DIC analysis.