Metal-Semiconductor Junctions
Fermi Level Dynamics
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Nicholas A Lanzillo1, Adam J Simbeck, Saroj K Nayak
1Department of Physics, Applied Physics and Astronomy, Rensselaer Polytechnic Institute, 110 8th Street, Troy, NY 12180, USA. Division of Science, Mathematics and Computing, Bard College, 30 Campus Road, Annandale-on-Hudson, NY 12504, USA.
Compressive and tensile strain significantly alter the work function of metal dichalcogenide monolayers. Strain engineering offers a tunable method to modify electronic properties for advanced material applications.
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