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CMOS-compatible optical switching concept based on strain-induced refractive-index tuning.
Optics Express
|April 4, 2015
Summary
We developed a novel planar lightwave switching mechanism using electrically-induced strain to alter refractive index in CMOS-compatible photonics. This enables ultra-compact, low-loss devices with high performance for optical switching applications.
Area of Science:
- Photonics and optical engineering
- Semiconductor device physics
- Materials science for optoelectronics
Background:
- Planar lightwave circuits (PLCs) are crucial for optical communication and signal processing.
- Existing tuning mechanisms for refractive index in PLCs often face limitations in compactness, efficiency, or material compatibility.
- Electrically controlled strain offers a promising avenue for dynamic refractive index modulation.
Purpose of the Study:
- To present and analyze a novel planar lightwave switching mechanism.
- To demonstrate the feasibility of using electrically-driven strain for large refractive index variations.
- To explore the potential for ultra-compact and efficient optical switching devices.
Main Methods:
- Numerical analysis of a Mach-Zehnder Interferometer (MZI) with Germanium (Ge) waveguides.
- Integration of a piezoelectric stressor for dynamic strain control in the MZI arms.
- Modeling of strain-induced modifications to the Ge band structure and refractive index.
Main Results:
- Achieved refractive index variations up to 0.05 through electrically-induced strain.
- Demonstrated potential for ultra-compact devices with low propagation loss (<2 dB insertion loss).
- Obtained high extinction ratios (>30 dB) for optical switching.
Conclusions:
- Electrically-driven strain control is a viable method for realizing high-performance planar lightwave switching.
- The proposed mechanism enables the development of compact photonic devices with excellent optical characteristics.
- Extending waveguide materials to SiGe(Sn) alloys can enable operation across the FIR spectrum.

