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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Amir F Payam1, Daniel Martin-Jimenez, Ricardo Garcia
1Instituto de Ciencia de Materiales de Madrid, CSIC Sor Juana Inés de la Cruz 3 28049 Madrid, Spain.
We developed a new method to transform amplitude modulation force microscopy observables into quantitative force measurements, enhancing nanomechanical analysis in various environments and materials.
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