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Updated: Apr 14, 2026

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
Published on: April 28, 2016
Raman spectra of few-layer phosphorene studied from first-principles calculations
Yanqing Feng1, Jian Zhou, Yongping Du
1Department of Physics and National Laboratory of Solid State Microstructures, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, People's Republic of China.
Abstract:
Raman spectra of few-layer phosphorene have been systematically studied using density functional theory calculations. We find that due to the interlayer van der Waals interactions, the low-frequency rigid layer Ag breathing mode and B1g shear mode can shift by as much as 45.1 cm(-1) and 38.5 cm(-1), respectively, as the layer numbers increase from 2L to 5L. In addition, a typical characteristic for the experimentally observable [Formula: see text] mode (~460 cm(-1) in bulk) is identified. Interestingly, this mode changes from coupled in-plane and out-of-plane vibrations in single layer to pure in-plane vibrations in a few layers and the corresponding frequencies vary by as much as over 10 cm(-1). We argue that this Raman frequency variation might be used to experimentally characterize the thickness of this intriguing 2D layered material.
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