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Updated: Apr 13, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Surface conductivity measurements in nanometric to micrometric foam films
Oriane Bonhomme1, Anne Mounier, Gilles Simon
1Institut Lumière Matière ILM, University Lyon 1-CNRS, UMR 5586, Domaine Scientifique de la Doua, Bâtiment Léon Brillouin 43 Boulevard du 11 Novembre 1918, 69622 Villeurbanne, France.
Abstract:
Foam films (a liquid lamella in air covered by surfactants) are tools of choice for nanofluidic characterization as they are intrinsically nanometric. Their size is indeed fixed by a balance between external pressure and particular molecular interactions in the vicinity of interfaces. To probe the exact nature of these interfaces, different characterizations can be performed. Among them, conductivity in confined systems is a direct probe of the electrostatic environment in the vicinity of the surface. Therefore, we designed a dedicated experiment to measure this conductivity in a cylindrical bubble coupled to interferometry for film thickness characterization. We then show that this conductivity depends on the surfactant nature. These conductivity measurements have been performed in an extremely confined system, the so called Newton black foam films. Unexpectedly in this case, a conductivity close to surface conductivity is recovered.
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