A dedicated compression device for high resolution X-ray tomography of compressed gas diffusion layers

C Tötzke1, I Manke1, G Gaiselmann2

  • 1Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 14109 Berlin, Germany.

Summary

This study introduces a new method to examine gas diffusion layer (GDL) microstructure under compression using synchrotron tomography. Findings reveal non-uniform compression in GDLs, impacting gas transport and water removal in fuel cells.